Moises Padilla

1 book

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications by Manuel Servin, Moises Padilla, J. Antonio Quiroga

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Manuel Servin, Moises Padilla, J. Antonio Quiroga

344 pages • missing pub info (editions)

nonfiction art technology medium-paced
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