Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications by Manuel Servin, Moises Padilla, J. Antonio Quiroga

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Manuel Servin, Moises Padilla, J. Antonio Quiroga

344 pages • missing pub info (editions)

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical ...

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